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High-accuracy current generation in the nanoampere regime from a silicon single-trap electron pump

Yamahata, G., Giblin, S.P., Kataoka, M., Karasawa, T. and Fujiwara, A.
Keywords:

Single-electron pump, silicon, trap level, current standard

Document typeArticle
Journal title / SourceScientific Reports
Volume7
Page numbers / Article number45137
Publisher's nameSpringer Nature
Publication date 2017-03-21
ISSN2045-2322
DOI10.1038/srep45137
LanguageEnglish

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