High-accuracy current generation in the nanoampere regime from a silicon single-trap electron pump

Yamahata G., Giblin S.P., Kataoka M., Karasawa T., Fujiwara A.

Single-electron pump, silicon, trap level, current standard

Document type Article
Journal title / Source Scientific Reports
Volume 7
Page numbers / Article number 45137
Publisher's name Springer Nature
Publication date 2017-3-21
ISSN 2045-2322
DOI 10.1038/srep45137
Language English

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