High-accuracy current generation in the nanoampere regime from a silicon single-trap electron pump
Yamahata G., Giblin S.P., Kataoka M., Karasawa T., Fujiwara A.Single-electron pump, silicon, trap level, current standard
| Document type | Article |
| Journal title / Source | Scientific Reports |
| Volume | 7 |
| Page numbers / Article number | 45137 |
| Publisher's name | Springer Nature |
| Publication date | 2017-3-21 |
| ISSN | 2045-2322 |
| DOI | 10.1038/srep45137 |
| Language | English |