Impact of parasitic coupling on multiline TRL calibration

Phung G. N., Schmuckle F. J., Doerner R. , Fritzsch T., Heinrich W.

Measurements, probes, coupling, parasitic modes, em simulation

Document type Proceedings
Journal title / Source 2017 47th European Microwave Conference (EuMC)
Page numbers / Article number 835-838
Publisher's name IEEE
Publication date 2017-10
Conference name 2017 47th European Microwave Conference
Conference date 10-10-2017 to 12-10-2017
Conference place Nuremberg
DOI 10.23919/EuMC.2017.8230974
Language English

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