Impact of parasitic coupling on multiline TRL calibration
Phung G. N., Schmuckle F. J., Doerner R. , Fritzsch T., Heinrich W.Measurements, probes, coupling, parasitic modes, em simulation
| Document type | Proceedings |
| Journal title / Source | 2017 47th European Microwave Conference (EuMC) |
| Page numbers / Article number | 835-838 |
| Publisher's name | IEEE |
| Publication date | 2017-10 |
| Conference name | 2017 47th European Microwave Conference |
| Conference date | 10-10-2017 to 12-10-2017 |
| Conference place | Nuremberg |
| DOI | 10.23919/EuMC.2017.8230974 |
| Web URL | https://www.fbh-berlin.com/publications-patents/publications/title/impact-of-parasitic-coupling-on-multiline-trl-calibration-1 |
| Language | English |