Datasets for fig3 A multi-resistance wide-range calibration sample for conductive probe atomic force microscopy measurements
François P.calibration, conductive probe atomic force microscopy, measurement protocol, nanoscale, resistance reference
| Document type | Datasets |
| Journal title / Source | Beilstein Journal of nanotechnology |
| Volume | 14 |
| Page numbers / Article number | 1141-1148 |
| Publisher's name | Beilstein |
| Publication date | 2024 |
| DOI | 10.5281/zenodo.13939223 |
| Language | English |