Analytical Jacobian and its application to tilted-wave interferometry
Fortmeier I., Stavridis M., Wiegmann A., Schulz M., Osten W., Elster C.Geometric optics : Mathematical methods (general), Interferometry, Metrology, Aspherics
| Document type | Article |
| Journal title / Source | Optics Express |
| Volume | 22 |
| Issue | 18 |
| Page numbers / Article number | 21313-21325 |
| Publication date | 2014-8 |
| Web URL | http://www.opticsinfobase.org/oe/abstract.cfm?uri=oe-22-18-21313 |