Metrological large range magnetic force microscopy

Dai G., Hu X., Sievers S., Fernández Scarioni A., Neu V., Fluegge J., Schumacher H.W.

metrological magnetic force microscopy, large range, stray field

Document type Article
Journal title / Source Review of Scientific Instruments
Volume 89
Issue 9
Page numbers / Article number 093703
Publisher's name AIP Publishing
Publication date 2018-9
ISSN 0034-6748, 1089-7623
DOI 10.1063/1.5035175
Language English

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