Metrological large range magnetic force microscopy
Dai G., Hu X., Sievers S., Fernández Scarioni A., Neu V., Fluegge J., Schumacher H.W.metrological magnetic force microscopy, large range, stray field
| Document type | Article |
| Journal title / Source | Review of Scientific Instruments |
| Volume | 89 |
| Issue | 9 |
| Page numbers / Article number | 093703 |
| Publisher's name | AIP Publishing |
| Publication date | 2018-9 |
| ISSN | 0034-6748, 1089-7623 |
| DOI | 10.1063/1.5035175 |
| Language | English |