Quantitative Measurement of Thermal Conductivity by SThM Technique: Measurements, Calibration Protocols and Uncertainty Evaluation

Fleurence N., Demeyer S., Allard A., Douri S., Hay B.

uncertainty, thermal conductivity, SThM, nanoscale, Monte Carlo method, propagation of distribution, error-in-variables, Bayesian analysis

Document type Article
Journal title / Source Nanomaterials
Volume 13
Issue 17
Page numbers / Article number 2424
Publisher's name MDPI AG
Publisher's address (city only) Basel, Switzerland
Publication date 2023-8-25
ISSN 2079-4991
DOI 10.3390/nano13172424
Web URL https://www.mdpi.com/2079-4991/13/17/2424
Language English

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