Si lattice parameter measurement by centimeter X-ray interferometry
Ferroglio Luca, Mana Giovanni, Massa Enrico| Document type | Article |
| Journal title / Source | Optics Express |
| Volume | 16 |
| Issue | 21 |
| Page numbers / Article number | 12 pages |
| Publication date | 2008-10-13 |
| DOI | 10.1364/OE.16.016877 |