Metrological Protocols for Reaching Reliable and SI-Traceable Size Results for Multi-Modal and Complexly Shaped Reference Nanoparticles
Feltin N., Deumer J., Gollwitzer C., Koops R., Sebaïhi N., Fontanges R., Neuwirth M., Bergmann D., Hüser D., Klein T., Salzmann C., Saint-Antonin F., Artous S., Crouzier L., Delvallée A., Pellegrino F., Maurino V., Bartczak D., Goenaga-Infante H., Taché O., Marguet S., Testard F., Hodoroaba V-D.certified reference nanomaterials; traceable nanoparticle size measurements; hybrid metrology; scanning probe microscopy; small-angle X-ray scattering; electron microscopy
| Document type | Article |
| Journal title / Source | Nanomaterials |
| Volume | 13 |
| Issue | 6 |
| Page numbers / Article number | 993 |
| Publisher's name | MDPI AG |
| Publisher's address (city only) | Basel, Switzerland |
| Publication date | 2023-3 |
| ISSN | 2079-4991 |
| DOI | 10.3390/nano13060993 |
| Web URL | https://www.mdpi.com/2079-4991/13/6/993 |
| Language | English |