Thermal/luminescence characterization and degradation mechanism analysis on phosphor-converted white LED chip scale packages
Fan X., Qian C., Yu C., Fan J., ZHAO G.Phosphor-converted white LED, Chip scale packages, Multicolor phosphors, Thermal/luminescence characterization, Degradation mechanisms
Document type | Article |
Journal title / Source | Microelectronics Reliability |
Volume | 74 |
Issue | July 2017 |
Page numbers / Article number | 179–185 |
Publisher's name | dongsheng ZHAO |
Publisher's address (city only) | New York |
Publication date | 2017-4 |
ISSN | 0026-2714 |
DOI | 10.1016/j.microrel.2017.04.012 |
Web URL | http://www.sciencedirect.com/science/article/pii/S0026271417301026 |
Language | English |