Thermal/luminescence characterization and degradation mechanism analysis on phosphor-converted white LED chip scale packages

Fan X., Qian C., Yu C., Fan J., ZHAO G.

Phosphor-converted white LED, Chip scale packages, Multicolor phosphors, Thermal/luminescence characterization, Degradation mechanisms

Document type Article
Journal title / Source Microelectronics Reliability
Volume 74
Issue July 2017
Page numbers / Article number 179–185
Publisher's name dongsheng ZHAO
Publisher's address (city only) New York
Publication date 2017-4
ISSN 0026-2714
DOI 10.1016/j.microrel.2017.04.012
Language English

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