Thermal/luminescence characterization and degradation mechanism analysis on phosphor-converted white LED chip scale packages
Fan X., Qian C., Yu C., Fan J., ZHAO G.Phosphor-converted white LED, Chip scale packages, Multicolor phosphors, Thermal/luminescence characterization, Degradation mechanisms
| Document type | Article |
| Journal title / Source | Microelectronics Reliability |
| Volume | 74 |
| Issue | July 2017 |
| Page numbers / Article number | 179–185 |
| Publisher's name | dongsheng ZHAO |
| Publisher's address (city only) | New York |
| Publication date | 2017-4 |
| ISSN | 0026-2714 |
| DOI | 10.1016/j.microrel.2017.04.012 |
| Web URL | http://www.sciencedirect.com/science/article/pii/S0026271417301026 |
| Language | English |