On the characterization of ultra-precise X-ray optical components: advances and challenges inex situmetrology
Falkenberg G., Störmer M., Zeschke T., Buchheim J., Siewert F., Sankari R.synchrotron optics; X-ray optics; metrology for synchrotron optics; slope measurement; NOM; multilayer; focusing mirrors
| Document type | Article |
| Journal title / Source | Journal of Synchrotron Radiation |
| Volume | 21 |
| Issue | 5 |
| Page numbers / Article number | 968-975 |
| Publisher's name | International Union of Crystallography (IUCr) |
| Publication date | 2014-8-27 |
| ISSN | 1600-5775 |
| DOI | 10.1107/S1600577514016221 |
| Language | English |