Fabrication of graphene quantum Hall resistance standard in a cryogen-freee table-top system
He H., Janssen T.J.B.M., Rozhko S., Tzalenchuk A., Lara-Avila S., Yakimova R., Kubatkin S.Epitaxial layers, Graphene, measurement standards, microfabrication, quantum hall effect
| Document type | Proceedings |
| Journal title / Source | Digest on Conference on Precision Electromagnetic Measurements (CPEM2016) |
| Peer-reviewed article | 1 |
| Publisher's name | IEEE |
| Publication date | 2016-8-11 |
| Conference name | CPEM 2016 |
| Conference date | 10-07-2016 to 15-07-2016 |
| Conference place | Ottawa, Canada |
| ISSN | 2160-0171 |
| DOI | 10.1109/CPEM.2016.7540516 |
| ISBN | 978-1-4673-9134-4 |
| Web URL | http://ieeexplore.ieee.org/document/7540516/?denied |
| Language | English |