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Extended S-parameters for imperfect test ports

Hoffmann J, Wollensack M, Ruefenacht J, Zeier M, Zeier Markus
Keywords:

vector network analyzer, S-parameter, connector

Document type Article
Journal title / Source Metrologia
Peer-reviewed article 1
Volume 52
Issue 1
Page numbers / Article number 121-129
Publisher's name IOP
Publisher's address (city only) n/a
Publication date 2016
ISSN n/a
DOI 10.1088/0026-1394/52/1/121
Language English

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Information

Project title (JRP)
SIB62: HFCircuits: Metrology for new electrical measurement quantities in high-frequency circuits
Name of Call / Funding Programme
EMRP A169: Call 2012 SI Broader scope (II)