Extended S-parameters for imperfect test ports
Hoffmann J, Wollensack M, Ruefenacht J, Zeier M, Zeier Markusvector network analyzer, S-parameter, connector
| Document type | Article |
| Journal title / Source | Metrologia |
| Peer-reviewed article | 1 |
| Volume | 52 |
| Issue | 1 |
| Page numbers / Article number | 121-129 |
| Publisher's name | IOP |
| Publisher's address (city only) | n/a |
| Publication date | 2016 |
| ISSN | n/a |
| DOI | 10.1088/0026-1394/52/1/121 |
| Language | English |