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Evaluating and Expressing Uncertainty in High-frequency Electromagnetic Measurements: A Selective Review

Ridler N. M., Salter M. J.
Keywords:

complex-valued quantities, electromagnetic measurement, microwave S-parameters, uncertainty of measurement

Document type Article
Journal title / Source Metrologia
Peer-reviewed article 1
Volume 51
Issue 4
Page numbers / Article number S191-S198
Publisher's name IOP Publishing
Publisher's address (city only) Bristol, United Kingdom
Publication date 2014-7-11
DOI 10.1088/0026-1394/51/4/S191
Web URL http://iopscience.iop.org/article/10.1088/0026-1394/51/4/S191
Language English

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Information

Project title (JRP)
SIB62: HFCircuits: Metrology for new electrical measurement quantities in high-frequency circuits
Name of Call / Funding Programme
EMRP A169: Call 2012 SI Broader scope (II)