Evaluation of EMI Effects on Static Electricity Meters
Wright P.S., Rietveld G., Leferink F., van den Brom H.E., Alonso F.R.I, Braun J.P., Ellingsberg K., Pous M., Svoboda M.Electromagnetic Compatibility, EMC immunity testing, energy measurement, static meters, standards, watthour meters.
| Document type | Article |
| Journal title / Source | 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018) |
| Publisher's name | IEEE |
| Publication date | 2018-7 |
| DOI | 10.1109/CPEM.2018.8500945 |
| Web URL | https://zenodo.org/record/3587786#.XiGxp3u7KUn |
| Language | English |