Evaluation of EMI Effects on Static Electricity Meters

Wright P.S., Rietveld G., Leferink F., van den Brom H.E., Alonso F.R.I, Braun J.P., Ellingsberg K., Pous M., Svoboda M.

Electromagnetic Compatibility, EMC immunity testing, energy measurement, static meters, standards, watthour meters.

Document type Article
Journal title / Source 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018)
Publisher's name IEEE
Publication date 2018-7
DOI 10.1109/CPEM.2018.8500945
Web URL https://zenodo.org/record/3587786#.XiGxp3u7KUn
Language English

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