Effect of Na presence during CuInSe2 growth on stacking fault annihilation and electronic properties
Stange H., Brunken S., Hempel H., Rodriguez-Alvarez H., Schäfer N., Greiner D., Scheu A., Lauche J., Kaufmann C. A., Unold T., Abou-Ras D., Mainz R.Stacking faults, Cu(In,Ga)Se2, thin films, solar cells, XRD, GIXRD, GDOES, grain growth, optical pump terahertz probe spectroscopy
Document type | Article |
Journal title / Source | Applied Physics Letters |
Peer-reviewed article | 1 |
Volume | 107 |
Issue | 15 |
Page numbers / Article number | 152103 |
Publisher's name | AIP Publishing LLC |
Publisher's address (city only) | College Park |
Publication date | 2015-10-14 |
ISSN | 0003-6951 |
DOI | 10.1063/1.4933305 |
Language | English |