Effect of Na presence during CuInSe2 growth on stacking fault annihilation and electronic properties

Stange H., Brunken S., Hempel H., Rodriguez-Alvarez H., Schäfer N., Greiner D., Scheu A., Lauche J., Kaufmann C. A., Unold T., Abou-Ras D., Mainz R.

Stacking faults, Cu(In,Ga)Se2, thin films, solar cells, XRD, GIXRD, GDOES, grain growth, optical pump terahertz probe spectroscopy

Document type Article
Journal title / Source Applied Physics Letters
Peer-reviewed article 1
Volume 107
Issue 15
Page numbers / Article number 152103
Publisher's name AIP Publishing LLC
Publisher's address (city only) College Park
Publication date 2015-10-14
ISSN 0003-6951
DOI 10.1063/1.4933305
Language English

Back to the list view