Effect of Na presence during CuInSe2 growth on stacking fault annihilation and electronic properties
Stange H., Brunken S., Hempel H., Rodriguez-Alvarez H., Schäfer N., Greiner D., Scheu A., Lauche J., Kaufmann C. A., Unold T., Abou-Ras D., Mainz R.Stacking faults, Cu(In,Ga)Se2, thin films, solar cells, XRD, GIXRD, GDOES, grain growth, optical pump terahertz probe spectroscopy
| Document type | Article |
| Journal title / Source | Applied Physics Letters |
| Peer-reviewed article | 1 |
| Volume | 107 |
| Issue | 15 |
| Page numbers / Article number | 152103 |
| Publisher's name | AIP Publishing LLC |
| Publisher's address (city only) | College Park |
| Publication date | 2015-10-14 |
| ISSN | 0003-6951 |
| DOI | 10.1063/1.4933305 |
| Language | English |