VNA Tools: Material Parameters Extraction from On-Wafer CPW S-Parameter Measurements
Eckmann B., Wollensack M., Ausden L., Hoffmann J., Zeier M.Vector Network Analyzer, S-parameters, Material parameters, On-wafer, Measurement uncertainty, VNA Tools
| Document type | Proceedings |
| Journal title / Source | |
| Publisher's name | IEEE |
| Publisher's address (city only) | Piscataway |
| Publication date | 2026-1-1 |
| Conference name | 106th ARFTG Microwave Measurement Conference |
| Conference date | 18-21 January 2026 |
| Conference place | Los Angeles, CA, USA |
| ISSN | 2767-8776 |
| DOI | 10.5281/zenodo.19629109 |