Development and application of reference and routine analytical methods providing SI-traceable results for the determination of technology-critical elements in PCB from WEEE
D. Giancarlo, O. Marcus, V. Jochen, G. Jean-Philippe (SMD), L. Nicolas (SMD), K. Ole, P. Daniel, D.L Marco, B. Luigi, J. Radojko, O. Caroline (DPM), I. Johanna, L. Shaun T., W. Anna, R. Anita, M. Lena, P. Axel, R. Olaf, S.A Timo, C. Oktay, K. Derya, N. Johanna (DPM)Technology-critical elements, PCB, WEEE recycling, INAA, ICP-MS, Circular Economy, Traceability, Digestion
| Document type | Article |
| Journal title / Source | Journal of Analytical Atomic Spectrometry |
| Publisher's name | Royal Society of Chemistry (RSC) |
| Publisher's address (city only) | Cambridge, United Kingdom |
| Publication date | 2024 |
| ISSN | 0267-9477, 1364-5544 |
| DOI | 10.1039/d4ja00235k |
| Language | English |