Embedded Digital Phase Noise Analyzer for Optical Frequency Metrology
Donadello S., Bertacco E.K., Calonico D., Clivati C.Digital signal processing (DSP), embedded system, frequency metrology, laser interferometry, lock-in amplifier, optical fiber sensing, phase measurement
| Document type | Article |
| Journal title / Source | IEEE Transactions on Instrumentation and Measurement |
| Volume | 72 |
| Page numbers / Article number | 1-12 |
| Publisher's name | Institute of Electrical and Electronics Engineers (IEEE) |
| Publisher's address (city only) | Piscataway, NJ, United States |
| Publication date | 2023 |
| ISSN | 0018-9456, 1557-9662 |
| DOI | 10.1109/TIM.2023.3288255 |
| Web URL | https://ieeexplore.ieee.org/document/10158734 |
| Language | English |