Differential phase-contrast dark-field electron holography for strain mapping
Denneulin TD, Houdellier FH, Hÿtch MHHolography, Strain, Dark-field
| Document type | Article |
| Journal title / Source | Ultramicroscopy |
| Peer-reviewed article | 1 |
| Volume | 160 |
| Page numbers / Article number | 98-109 |
| Publisher's name | Elsevier |
| Publisher's address (city only) | Amsterdam |
| Publication date | 2016-1 |
| ISSN | 0304-3991 |
| DOI | 10.1016/j.ultramic.2015.10.002 |
| Web URL | http://ac.els-cdn.com/S0304399115300413/1-s2.0-S0304399115300413-main.pdf?_tid=1483b9e4-2c9c-11e6-bcb1-00000aacb360&acdnat=1465296135_21b142ecc9403c0b9422c6e875ce4c82 |
| Language | English |