Differential phase-contrast dark-field electron holography for strain mapping
Denneulin TD, Houdellier FH, Hÿtch MHHolography, Strain, Dark-field
Document type | Article |
Journal title / Source | Ultramicroscopy |
Peer-reviewed article | 1 |
Volume | 160 |
Page numbers / Article number | 98-109 |
Publisher's name | Elsevier |
Publisher's address (city only) | Amsterdam |
Publication date | 2016-1 |
ISSN | 0304-3991 |
DOI | 10.1016/j.ultramic.2015.10.002 |
Web URL | http://ac.els-cdn.com/S0304399115300413/1-s2.0-S0304399115300413-main.pdf?_tid=1483b9e4-2c9c-11e6-bcb1-00000aacb360&acdnat=1465296135_21b142ecc9403c0b9422c6e875ce4c82 |
Language | English |