Development of a System for Measuring the Shape of β Spectra Using a Semiconductor Si Detector
BISCH CB, MOUGEOT XM, BE MB, NOURREDDINE ANBeta spectra, semi-conductor detector
Document type | Article |
Journal title / Source | Nuclear Data Sheets |
Peer-reviewed article | 1 |
Volume | 120 |
Issue | - |
Page numbers / Article number | 95-98 |
Publisher's name | ELSEVIER |
Publisher's address (city only) | Amsterdam |
Publication date | 2014 |
ISSN | 0090-3752 |
DOI | 10.1016/j.nds.2014.07.016 |
Web URL | - |
Language | English |
Persistent Identifier | http://www.sciencedirect.com/science/article/pii/S0090375214004682 |