Development of a System for Measuring the Shape of β Spectra Using a Semiconductor Si Detector
BISCH CB, MOUGEOT XM, BE MB, NOURREDDINE ANBeta spectra, semi-conductor detector
| Document type | Article |
| Journal title / Source | Nuclear Data Sheets |
| Peer-reviewed article | 1 |
| Volume | 120 |
| Issue | - |
| Page numbers / Article number | 95-98 |
| Publisher's name | ELSEVIER |
| Publisher's address (city only) | Amsterdam |
| Publication date | 2014 |
| ISSN | 0090-3752 |
| DOI | 10.1016/j.nds.2014.07.016 |
| Web URL | - |
| Language | English |
| Persistent Identifier | http://www.sciencedirect.com/science/article/pii/S0090375214004682 |