The gateway to Europe's
integrated metrology community.

Development of a System for Measuring the Shape of β Spectra Using a Semiconductor Si Detector

BISCH CB, MOUGEOT XM, BE MB, NOURREDDINE AN
Keywords:

Beta spectra, semi-conductor detector

Document type Article
Journal title / Source Nuclear Data Sheets
Peer-reviewed article 1
Volume 120
Issue -
Page numbers / Article number 95-98
Publisher's name ELSEVIER
Publisher's address (city only) Amsterdam
Publication date 2014
ISSN 0090-3752
DOI 10.1016/j.nds.2014.07.016
Web URL -
Language English
Persistent Identifier http://www.sciencedirect.com/science/article/pii/S0090375214004682

Back to the list view

Information

Project title (JRP)
HLT11: MetroMRT: Metrology for molecular radiotherapy
Name of Call / Funding Programme
EMRP A169: Call 2011 Metrology for Health