Developing Traceability for S-parameter Measurements at Millimeter and Submillimeter Wavelengths
Ridler N., Clarke R., Salter M., Wilson A.millimeter-wave measurements, submillimeter-wave measurements, measurement traceability, S-parameter measurements
| Document type | Article |
| Journal title / Source | IEEE Microwave Magazine |
| Peer-reviewed article | 1 |
| Volume | 14 |
| Issue | 7 |
| Page numbers / Article number | 67 - 74 |
| Publisher's name | Institute of Electrical and Electronics Engineers (IEEE) |
| Publisher's address (city only) | New York, USA |
| Publication date | 2013-11-1 |
| ISSN | 1527-3342 |
| DOI | 10.1109/MMM.2013.2280311 |
| Web URL | http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=6668984 |
| Language | English |