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Developing Traceability for S-parameter Measurements at Millimeter and Submillimeter Wavelengths

Ridler N., Clarke R., Salter M., Wilson A.
Keywords:

millimeter-wave measurements, submillimeter-wave measurements, measurement traceability, S-parameter measurements

Document type Article
Journal title / Source IEEE Microwave Magazine
Peer-reviewed article 1
Volume 14
Issue 7
Page numbers / Article number 67 - 74
Publisher's name Institute of Electrical and Electronics Engineers (IEEE)
Publisher's address (city only) New York, USA
Publication date 2013-11-1
ISSN 1527-3342
DOI 10.1109/MMM.2013.2280311
Web URL http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=6668984
Language English

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Information

Project title (JRP)
SIB62: HFCircuits: Metrology for new electrical measurement quantities in high-frequency circuits
Name of Call / Funding Programme
EMRP A169: Call 2012 SI Broader scope (II)