Determination of impedance meter nonlinearity with a capacitance build-up method
Pourdanesh F, D'Elia V, Ortolano M, Callegaro LCapacitance, Capacitors, Uncertainty, Metrology, Capacitance measurement, Calibration, Linearity
| Document type | Proceedings |
| Journal title / Source | 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016) |
| Peer-reviewed article | 1 |
| Volume | . |
| Issue | . |
| Page numbers / Article number | 1-2 |
| Publisher's name | IEEE |
| Publisher's address (city only) | . |
| Publication date | 2016 |
| Conference name | 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016) |
| Conference date | 10-15 July 2016 |
| Conference place | Ottawa, Canada |
| ISSN | 978-1-4673-9134-4 |
| DOI | 10.1109/CPEM.2016.7540710 |
| ISBN | 978-1-4673-9134-4 |
| Web URL | http://ieeexplore.ieee.org/document/7540710/ |
| Language | English |