Detection efficiency calibration of single-photon silicon avalanche photodiodes traceable using double attenuator technique

López M., Hofer H., Kück S.
Keywords:

detection efficiency, Si-SPAD, photon statistics

Document type Article
Journal title / Source Journal of Modern Optics
Peer-reviewed article 1
Volume 62
Issue S2
Page numbers / Article number S21-S27
Publisher's name Taylor & Francis.
Publisher's address (city only) London
Publication date 2015-3-27
ISSN 0950-0340
DOI 10.1080/09500340.2015.1021724
Web URL http://www.tandfonline.com/loi/tmop20
Language English

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