The gateway to Europe's
integrated metrology community.

Design and manufacturing of a high accuracy planarscanner for millimeter wave applications

Le Coq L, Fuchs B
Keywords:

design engineering;image scanners;millimetre wave devices;planar antennas;IETR compact range;accuracy planar 2D scanner;design;planar millimeter wave measurements;quiet zone probing;Accuracy;Antenna measurements;Antennas;Extraterrestrial measurements;Measurement uncertainty;Millimeter wave measurements;Semiconductor device modeling

Document type Proceedings
Journal title / Source Digest of IEEE Conference on Antenna Measurements & Applications (CAMA), 2014
Volume n/a
Issue n/a
Page numbers / Article number 1- 4
Publisher's name IEEE
Publisher's address (city only) n/a
Publication date 2014-11-16
Conference name 2014 IEEE Conference on Antenna Measurements & Applications (CAMA)
Conference date 16-19 Nov. 2014
Conference place Antibes Juan-les-Pins , France
ISSN n/a
DOI 10.1109/CAMA.2014.7003388
ISBN n/a
Web URL http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7003388&isnumber=7003303
Language English

Back to the list view

Information

Name of Call / Funding Programme
EMRP A169: Call 2012 Metrology for Industry (II)