Design and Calibration of a Compact Quasi-Optical System for Material Characterization in Millimeter/Sub-millimeter Wave Domain

Kazemipour A., Hudlicka M., Yee S.-K., Salhi M., Kleine-Ostmann T., Schrader T.
Document type Article
Journal title / Source IEEE Transactions on Instrumentation and Measurement
Volume 64
Issue 6
Page numbers / Article number 1438-1445
Publication date 2015-6
ISSN 0018-9456
DOI 10.1109/TIM.2014.2376115
Language English

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