Quantum imaging with sub-Poissonian light: challenges and perspectives in optical metrology

Berchera I.R., Degiovanni I.P.

quantum imaging, quantum correlations, quantum metrology, quantum enhancedmeasurement, quantum optics

Document type Article
Journal title / Source Metrologia
Volume 56
Issue 2
Page numbers / Article number 024001
Publisher's name IOP Publishing
Publication date 2019-1-25
ISSN 0026-1394, 1681-7575
DOI 10.1088/1681-7575/aaf7b2
Language English

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