CVD Graphene for Electrical Quantum Metrology
Thodkar K., Nef C., Fu W., Schönenberger C., Calame M., Lüönd F., Overney F., Jeanneret B.C,CVD graphene,Chemical Vapor Deposition (CVD),Copper (Cu),Electrical resistance measurement,Films,Graphene,Graphene (G),Magnetic field measurement,Quantum Hall effect (QHE),Raman spectra,Raman spectroscopy,Resistance,Substrates,Temperature measurement,chemical vapor deposition,chemical vapour deposition,electric variables measurement,electrical quantum metrology,electrical transport measurements,graphene,quantum Hall effect
| Document type | Proceedings |
| Journal title / Source | 29th Conference on Precision Electromagnetic Measurements (CPEM 2014), |
| Page numbers / Article number | 540--541 |
| Publisher's name | IEEE |
| Publication date | 2014-8 |
| ISSN | 0589-1485 |
| DOI | 10.1109/CPEM.2014.6898498 |
| ISBN | 978-1-4799-2479-0 |
| Web URL | http://ieeexplore.ieee.org/lpdocs/epic03/wrapper.htm?arnumber=6898498 |
| Language | English |