Convenient Graphene-Based Quantum Hall Resistance Standards
Brun-Pcard J., Ribeiro-Palau R., Lafont F., Kazazis D., Michon A., Cheynis F., Couturaud O., Consejo C., Jouault B., Poirier W., Schopfer F.Graphene, materials science and technology, measurement standards, metrology, quantum Hall effect devices
| Document type | Proceedings |
| Journal title / Source | Digest on Conference on Precision Electromagnetic Measurements (CPEM2016) |
| Peer-reviewed article | 1 |
| Publisher's name | IEEE |
| Publication date | 2016-8-11 |
| Conference name | CPEM 2016 |
| Conference date | 10-07-2016 to 15-07-2016 |
| Conference place | Ottawa, Canada |
| ISSN | 2160-0171 |
| DOI | 10.1109/CPEM.2016.7540650 |
| ISBN | 978-1-4673-9134-4 |
| Web URL | http://ieeexplore.ieee.org/document/7540650/ |
| Language | English |