Convenient Graphene-Based Quantum Hall Resistance Standards

Brun-Pcard J., Ribeiro-Palau R., Lafont F., Kazazis D., Michon A., Cheynis F., Couturaud O., Consejo C., Jouault B., Poirier W., Schopfer F.

Graphene, materials science and technology, measurement standards, metrology, quantum Hall effect devices

Document type Proceedings
Journal title / Source Digest on Conference on Precision Electromagnetic Measurements (CPEM2016)
Peer-reviewed article 1
Publisher's name IEEE
Publication date 2016-8-11
Conference name CPEM 2016
Conference date 10-07-2016 to 15-07-2016
Conference place Ottawa, Canada
ISSN 2160-0171
DOI 10.1109/CPEM.2016.7540650
ISBN 978-1-4673-9134-4
Language English

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