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Comparison between time- and frequency-domain high-frequency device characterizations

Bieler M., Arz U.
Keywords:

high-frequency devices, vector network analyzer, electro-optic sampling

Document type Proceedings
Journal title / Source CPEM 2016, Conference on Precision Electromagnetic Measurements: conference digest: (2016)
Peer-reviewed article 1
Publisher's name IEEE
Publication date 2016-8-11
Conference name CPEM 2016, Conference on Precision Electromagnetic Measurements
Conference date 10-15 July 2016
Conference place Ottawa, Canada
ISSN 2160-0171
DOI 10.1109/CPEM.2016.7540727
Web URL http://dx.doi.org/10.1109/CPEM.2016.7540727
Language English
Persistent Identifier https://oar.ptb.de/resources/show/10.7795/EMPIR.14IND02.CA.20190403E

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Name of Call / Funding Programme
EMPIR 2014: Industry