Comparison Between GaAs and Graphene QHR Standards for Resistance Realisation at SP

Bergsten T., Eklund G.

Calibration, graphene, quantum Hall effect, resistance standard

Document type Proceedings
Journal title / Source Digest on Conference on Precision Electromagnetic Measurements (CPEM2016)
Peer-reviewed article 1
Publisher's name IEEE
Publication date 2016
Conference name CPEM 2016
Conference date 10-07-2016 to 15-07-2016
Conference place Ottawa, Canada
ISSN 2160-0171
DOI 10.1109/CPEM.2016.7540514
ISBN 978-1-4673-9134-4
Language English

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