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Characterizing Cable Flexure Effects in S-parameter Measurements

Mubarak F.A., Rietveld G., Hoogenboom D., Spirito M.
Keywords:

VNA, PNA, S-parameters, cable effects, cable flexure, impedance, de-embedding, measurement, measurement techniques.

Document type Proceedings
Journal title / Source Microwave Measurement Conference, 2013 82nd ARFTG
Peer-reviewed article 1
Volume n/a
Issue 82nd ARFTG proceedings
Page numbers / Article number 1-7
Publisher's name IEEE
Publisher's address (city only) n/a
Publication date 2013-11-18
ISSN n/a
DOI 10.1109/ARFTG-2.2013.6737336
Language English

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Information

Project title (JRP)
SIB62: HFCircuits: Metrology for new electrical measurement quantities in high-frequency circuits
Name of Call / Funding Programme
EMRP A169: Call 2012 SI Broader scope (II)