Characterizing Cable Flexure Effects in S-parameter Measurements
Mubarak F.A., Rietveld G., Hoogenboom D., Spirito M.VNA, PNA, S-parameters, cable effects, cable flexure, impedance, de-embedding, measurement, measurement techniques.
Document type | Proceedings |
Journal title / Source | Microwave Measurement Conference, 2013 82nd ARFTG |
Peer-reviewed article | 1 |
Volume | n/a |
Issue | 82nd ARFTG proceedings |
Page numbers / Article number | 1-7 |
Publisher's name | IEEE |
Publisher's address (city only) | n/a |
Publication date | 2013-11-18 |
ISSN | n/a |
DOI | 10.1109/ARFTG-2.2013.6737336 |
Language | English |