Characterization of hybrid metal/semiconductor electron pumps for quantum metrology
Charron T., Devoille L., Djordjevic S., Séron O., Piquemal F., Clapera P., Ray S. J., Jehl X., Wacquez R., Vinet M.Electron pumps, Cryogenic current comparator, Quantum metrology
| Document type | Proceedings |
| Journal title / Source | Conference on Precision Electromagnetic Measurements (CPEM) Digest 2014, IEEE Catalog Number: CFP14PEM-CDR |
| Page numbers / Article number | 442-443 |
| Publication date | 2014 |
| Conference name | Conference on Precision Electromagnetic Measurements |
| Conference date | 24-29 August 2014 |
| Conference place | Rio de Janeiro |
| ISBN | 978-1-4799-2478-3 |
| Language | English |