Recent advances and perspectives in quantum electrical metrology with epitaxial graphene
Chae D., He H., Kruskopf M.Quantum electrical metrology, graphene, quantum Hall resistance standard
| Document type | Article |
| Journal title / Source | Measurement Science and Technology |
| Volume | 37 |
| Issue | 15 |
| Page numbers / Article number | 151001 |
| Publisher's name | IOP Publishing |
| Publisher's address (city only) | Braunschweig |
| Publication date | 2026-1-1 |
| ISSN | 0957-0233,1361-6501 |
| DOI | 10.1088/1361-6501/ae57c8 |