S-Parameter Analysis of Age Testing Effects on FR4-Based Printed Circuit Boards up to 10 GHz
Capriglione D., Betta G., Cohodarevic S., Sarcevic S., Sibonjic O., Robador A., Wickham M., Manning L., Salter M., Miele G.PCB, aging test, characterization, environmental testing
| Document type | Proceedings |
| Journal title / Source | 2024 IEEE International Symposium on Measurements & Networking proceedings |
| Publication date | 2024-8 |
| Conference name | 2024 IEEE International Symposium on Measurements & Networking |
| Conference date | 02-07-2024 to 05-07-2024 |
| Conference place | Rome, Italy |
| DOI | 10.5281/zenodo.13842792 |
| Language | English |