Experiences with a two terminal-pair digital impedance bridge
Callegaro Luca, D'Elia V., Kampik Marian, Bee Kim Dan, Ortolano Massimo, Pourdanesh FaranakMetrology, impedance, admittance, measurement standards, precision measurements, bridge circuits.
Document type | Proceedings |
Journal title / Source | CPEM 2014 Digest |
Page numbers / Article number | 222 - 223 |
Publication date | 2014 |
Conference name | 29th Conference on Precision Electromagnetic Measurements |
Conference date | 24 - 29 August 2014 |
Conference place | Rio de Janeiro, Brazil |
ISSN | 0589-1485 |
DOI | 10.1109/CPEM.2014.6898339 |
Web URL | http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6898339 |