Experiences with a two terminal-pair digital impedance bridge

Callegaro Luca, D'Elia V., Kampik Marian, Bee Kim Dan, Ortolano Massimo, Pourdanesh Faranak
Keywords:

Metrology, impedance, admittance, measurement standards, precision measurements, bridge circuits.

Document type Proceedings
Journal title / Source CPEM 2014 Digest
Page numbers / Article number 222 - 223
Publication date 2014
Conference name 29th Conference on Precision Electromagnetic Measurements
Conference date 24 - 29 August 2014
Conference place Rio de Janeiro, Brazil
ISSN 0589-1485
DOI 10.1109/CPEM.2014.6898339
Web URL http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6898339

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