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Calibration/Verification Standards for Measurement of Extremely High Impedances

Haase Martin, Hoffmann Karel
Keywords:

CST, High impedances, HFSS, Higher order modes, Measurement standards, Microwave connectors, Resistors, Scanning microwave microscopy, Thin film devices

Document type Proceedings
Journal title / Source Proc. of the 86th Microwave Measurement Conference (ARFTG)
Peer-reviewed article 1
Volume 86
Issue n/a
Page numbers / Article number 1-4
Publisher's name IEEE
Publisher's address (city only) Piscataway
Publication date 2015-12-3
Conference name 86th Microwave Measurement Conference (ARFTG)
Conference date 3-4 December 2015
Conference place Atlanta, Georgia, USA
ISSN n/a
DOI 10.1109/ARFTG.2015.7381474
ISBN 978-1-4673-9246-4
Web URL http://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=7381474
Language English
Persistent Identifier http://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=7381474

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Information

Project title (JRP)
SIB62: HFCircuits: Metrology for new electrical measurement quantities in high-frequency circuits
Name of Call / Funding Programme
EMRP A169: Call 2012 SI Broader scope (II)