Calibration/Verification Standards for Measurement of Extremely High Impedances
Haase Martin, Hoffmann KarelCST, High impedances, HFSS, Higher order modes, Measurement standards, Microwave connectors, Resistors, Scanning microwave microscopy, Thin film devices
| Document type | Proceedings |
| Journal title / Source | Proc. of the 86th Microwave Measurement Conference (ARFTG) |
| Peer-reviewed article | 1 |
| Volume | 86 |
| Issue | n/a |
| Page numbers / Article number | 1-4 |
| Publisher's name | IEEE |
| Publisher's address (city only) | Piscataway |
| Publication date | 2015-12-3 |
| Conference name | 86th Microwave Measurement Conference (ARFTG) |
| Conference date | 3-4 December 2015 |
| Conference place | Atlanta, Georgia, USA |
| ISSN | n/a |
| DOI | 10.1109/ARFTG.2015.7381474 |
| ISBN | 978-1-4673-9246-4 |
| Web URL | http://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=7381474 |
| Language | English |
| Persistent Identifier | http://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=7381474 |