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Calibration/Verification Standards for Measurement of Extremely High Impedances

Haase Martin, Hoffmann Karel

CST, High impedances, HFSS, Higher order modes, Measurement standards, Microwave connectors, Resistors, Scanning microwave microscopy, Thin film devices

Document type Proceedings
Journal title / Source Proc. of the 86th Microwave Measurement Conference (ARFTG)
Peer-reviewed article 1
Volume 86
Issue n/a
Page numbers / Article number 1-4
Publisher's name IEEE
Publisher's address (city only) Piscataway
Publication date 2015-12-3
Conference name 86th Microwave Measurement Conference (ARFTG)
Conference date 3-4 December 2015
Conference place Atlanta, Georgia, USA
ISSN n/a
DOI 10.1109/ARFTG.2015.7381474
ISBN 978-1-4673-9246-4
Language English
Persistent Identifier

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Project title (JRP)
SIB62: HFCircuits: Metrology for new electrical measurement quantities in high-frequency circuits
Name of Call / Funding Programme
EMRP A169: Call 2012 SI Broader scope (II)