Investigation of AMN Impedance Uncertainty Contribution in Conducted Emission Tests
Cakir S., Sen O., Kriz A., Büyük S., Ayaydın A.AMN, LISN, Uncertainty
| Document type | Article |
| Journal title / Source | IEEE Electromagnetic Compatibility Magazine |
| Volume | 12 |
| Issue | 4 |
| Page numbers / Article number | 41-49 |
| Publisher's name | Institute of Electrical and Electronics Engineers (IEEE) |
| Publisher's address (city only) | Piscataway, NJ, United States |
| Publication date | 2024-3-11 |
| ISSN | 2162-2264, 2162-2272 |
| DOI | 10.1109/MEMC.2023.10466409 |
| Web URL | https://zenodo.org/records/14511967 |
| Language | English |