Memristive devices for metrological applications
Cabral V., Valov I., Cardoso S., Callegaro L., De Leo N., Boarino L., Godinho I., Ribeiro L., Pereira J., Chen S., Cultrera A., Milano G.memristive, quantum conductance, quantum resistance, nanometrology
| Document type | Article |
| Journal title / Source | Acta IMEKO |
| Volume | 12 |
| Issue | 3 |
| Page numbers / Article number | 1-5 |
| Publisher's name | IMEKO International Measurement Confederation |
| Publisher's address (city only) | Budapest, Hungary |
| Publication date | 2023-9-26 |
| ISSN | 2221-870X, 0237-028X |
| DOI | 10.21014/actaimeko.v12i3.1450 |
| Web URL | https://acta.imeko.org/index.php/acta-imeko/article/view/1450 |
| Language | English |