Customized Piezoresistive Microprobes for Combined Imaging of Topography and Mechanical Properties (Raw Data)
Cantilever microprobe, Piezoresistive, Atomic force microscopy, Force–distance curves, Contact resonance, Lubricants
Document type | Datasets |
Journal title / Source | |
Web URL | https://zenodo.org/record/4610489 |
Persistent Identifier | https://doi.org/10.5281/zenodo.4610489 |