Surface layer determination for the Si spheres of the Avogadro project

Busch I., Azuma Y., Bettin H., Cibik L., Fuchs P., Fujii K., Krumrey M., Kutegens U., Kuramoto N., Mizushima S.

surface layer, XPS measurements, XRF measurements.

Document type Article
Journal title / Source Metrologia
Volume 48
Issue 2
Publication date 2011-3-22
DOI 10.1088/0026-1394/48/2/S10

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