High-resolution Fourier transform measurements of line strengths in the 00^02-00^00 main isotopologue band of nitrous oxide
Brunzendorf Jens, Werwein Viktor, Serdyukov Anton, Li Gang, Ebert Volker, Werhahn OlavNitrous oxide, Fourier transform infrared spectroscopy, spectral line parameters, line strengths, gas metrology
| Document type | Article |
| Journal title / Source | Applied Optics |
| Volume | 56 |
| Issue | 11 |
| Page numbers / Article number | E99-E105 |
| Publisher's name | The Optical Society |
| Publisher's address (city only) | 2010 Massachusetts Ave, NW Washington, DC 20036-1023, USA |
| Publication date | 2017-3-17 |
| ISSN | 0003-6935, 1539-4522 |
| DOI | 10.1364/ao.56.000e99 |
| Language | English |