High-resolution Fourier transform measurements of line strengths in the 00^02-00^00 main isotopologue band of nitrous oxide

Brunzendorf Jens, Werwein Viktor, Serdyukov Anton, Li Gang, Ebert Volker, Werhahn Olav
Keywords:

Nitrous oxide, Fourier transform infrared spectroscopy, spectral line parameters, line strengths, gas metrology

Document type Article
Journal title / Source Applied Optics
Volume 56
Issue 11
Page numbers / Article number E99-E105
Publisher's name The Optical Society
Publisher's address (city only) 2010 Massachusetts Ave, NW Washington, DC 20036-1023, USA
Publication date 2017-3-17
ISSN 0003-6935, 1539-4522
DOI 10.1364/ao.56.000e99
Language English

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