Measuring Wideband Nonlinearity of Analog to Digital Converters
Belcher R., Palafox L.Wideband, effective number of bits, precision audio, ADC, DAC, internodulation
| Document type | Article |
| Journal title / Source | 2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) |
| Page numbers / Article number | 1-6 |
| Publisher's name | IEEE |
| Publisher's address (city only) | Piscataway, NJ, United States |
| Publication date | 2024-5-20 |
| DOI | 10.5281/zenodo.11473289 |
| Language | English |