Fundamental parameter determination to improve spectroscopical methods

Beckhoff B., Pollakowski B., Muller M., Honicke P., Kolbe M.

X-ray fluorescence, atomic fundamental parameters, fluorescence yields, optical constants, spectroscopy

Document type Proceedings
Journal title / Source Precision Electromagnetic Measurements (CPEM 2016), 2016 Conference on
Publisher's name IEEE
Publication date 2016-7-10
Conference name 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016)
Conference date 10-07-2016 to 15-07-2016
Conference place Ottawa
DOI 10.1109/CPEM.2016.7540520
Language English

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