Fundamental parameter determination to improve spectroscopical methods
Beckhoff B., Pollakowski B., Muller M., Honicke P., Kolbe M.X-ray fluorescence, atomic fundamental parameters, fluorescence yields, optical constants, spectroscopy
Document type | Proceedings |
Journal title / Source | Precision Electromagnetic Measurements (CPEM 2016), 2016 Conference on |
Publisher's name | IEEE |
Publication date | 2016-7-10 |
Conference name | 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016) |
Conference date | 10-07-2016 to 15-07-2016 |
Conference place | Ottawa |
DOI | 10.1109/CPEM.2016.7540520 |
Language | English |