Fundamental parameter determination to improve spectroscopical methods
Beckhoff B., Pollakowski B., Muller M., Honicke P., Kolbe M.X-ray fluorescence, atomic fundamental parameters, fluorescence yields, optical constants, spectroscopy
| Document type | Proceedings |
| Journal title / Source | Precision Electromagnetic Measurements (CPEM 2016), 2016 Conference on |
| Publisher's name | IEEE |
| Publication date | 2016-7-10 |
| Conference name | 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016) |
| Conference date | 10-07-2016 to 15-07-2016 |
| Conference place | Ottawa |
| DOI | 10.1109/CPEM.2016.7540520 |
| Language | English |