Traceable Characterization of Nanomaterials by X-ray Spectrometry Using Calibrated Instrumentation
Beckhoff B.traceability, characterization, elemental analysis, speciation, nanostructures, nanoparticles, XRF, GIXRF, XAFS, XES
| Document type | Article |
| Journal title / Source | Nanomaterials |
| Volume | 12 |
| Issue | 13 |
| Page numbers / Article number | 2255 |
| Publisher's name | MDPI AG |
| Publication date | 2022-6-30 |
| ISSN | 2079-4991 |
| DOI | 10.3390/nano12132255 |
| Language | English |