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Electrometer Calibration With Sub-Part-Per-Million Uncertainty

Scherer H., Drung D., Krause C., Götz M., Becker U.
Keywords:

Ammeters, calibration, current measurement, measurement standards, measurement uncertainty, precisionmeasurements

Document type Article
Journal title / Source IEEE Transactions on Instrumentation and Measurement
Volume 68
Issue 6
Page numbers / Article number 1887-1894
Publisher's name Institute of Electrical and Electronics Engineers (IEEE)
Publication date 2019-6
ISSN 0018-9456, 1557-9662
DOI 10.1109/TIM.2019.2900129
Language English

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Information

Project title (JRP)
15SIB08: e-SI-Amp: Quantum realisation of the SI ampere
Name of Call / Funding Programme
EMPIR 2015: SI Broader Scope