(DATASET)In-situ scanning gate imaging of individual two-level material defects in live superconducting quantum circuits
Banerjee R., Hegedus M.TLS, scanning gate microscopy, decoherence, superconducting circuits
| Journal title / Source | |
| Publisher's name | Zenodo |
| Publication date | 2025-1-1 |
| DOI | 10.5281/zenodo.14750323 |