Development of time-resolved photoluminescence microscopy of semiconductor materials and devices using a compressed sensing approach
Baltušis A., Koutsourakis G., Wood S., Sweeney S.J (BEV)Measurement Science and Technology
| Document type | Article |
| Journal title / Source | Measurement Science and Technology |
| Volume | 35 |
| Issue | 1 |
| Page numbers / Article number | 015207 |
| Publisher's name | IOP Publishing |
| Publisher's address (city only) | Bristol, United Kingdom |
| Publication date | 2023-10-26 |
| ISSN | 0957-0233, 1361-6501 |
| DOI | 10.1088/1361-6501/ad044f |
| Language | English |