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The Tilted Wave Interferometer (TWI): A quick and flexible approach to measure aspheric and freeform surfaces

Baer, G., Schindler, J., Pruss, C. and Osten, W.
Keywords:

Metrology, Aspheres, Free-Forms, Tilted-Wave-Interferometer, Non-Null

Document typeProceeding
Journal title / SourceProceedings to 28th Annual Meeting of the American Society for Precision Engineering
Volume28
Publication date 2013
Conference name28th Annual Meeting of the American Society for Precision Engineering
Conference date20 - 25 October 2013
Conference placeSt. Paul, MN, USA
Web URLhttp://www.aspe.net/publications/Short%20Abstracts%2013A/3807.pdf
LanguageEnglish

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